Class Restriction And Registration Summary


EE 67039 - Section 01: Imaging Technologies (CRN 25459)
Long Title: Imaging Technologies for Micro and Nano Technologies

Course Description:
This course will survey a variety of imaging methods including optical, scanning probes, and electron beams. Each of these has multiple variations that will be explored in the course.

Associated Term: Spring Semester 2012
Campus: Main
Credits: 3
Grade Mode: Standard Letter
Course may not be repeated

Must have the following Classifications:
Senior (04) ,  Graduate- PhD. (GP) ,  Graduate (GR)
Must be enrolled in one of the following Levels:
Employee Non-Degree (EM) ,  Graduate Architecture (GA) ,  Graduate Non-Degree (GD) ,  Graduate (GR) ,  Undergraduate (UG)
Must be enrolled in one of the following Campuses:
Main (M)

Course Attributes:
ZTST - Final exam

Registration Availability (Overflow: Off )
  Maximum Actual Remaining
TOTAL 10 6 4

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Instructor's Description of Course » Bernstein, Gary » EE  67039 - Section 01:  Imaging Technologies (CRN 25459)
No descriptions have yet been provided for this course and instructor.
Enrollment History » EE 67039 Imaging Technologies (CRN 25459)
Enrollment over the last three years
Course was recently taught in SP11
Average number of students: 5
Composition of Students First Year Soph Junior Senior/5th Grad/Prof
Arts and Letters       17%  
Engineering       17% 67%

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